Abstract: Static test compaction aims to reduce the number of generated test patterns after automatic test pattern generation (ATPG) to enable one pattern to detect more faults. However, existing ...
Abstract: With the development of the intelligent and connected automobile industry, vehicles have become important information terminals integrated into the interconnection system. The data generated ...
一些您可能无法访问的结果已被隐去。
显示无法访问的结果